List of Contributors xiii Preface xv Acronyms xvii About the Book xxi 1 Introduction 1 Charvaka Duvvury 1.1 Definition of Co-Design 1 1.2 Overview of the Book 2 1.3 Challenges of System Level ESD Protection 2 1.4 Importance of System Level Protection 2 1.5 Industry-Wide Perception 5 1.6 Purpose and Motivation 8 1.7 Organization and Approach 8 1.
8 Outcome for the Reader 12 Acknowledgments 12 References 12 2 Component versus System Level ESD 14 Charvaka Duvvury and Harald Gossner 2.1 ESD Threat in the Real World 14 2.1.1 ESD Control 14 2.1.2 ESD Failure Types 15 2.1.3 ESD Protection Areas 16 2.
1.4 ESD Stress Models 17 2.2 Component ESD Qualification 17 2.2.1 Component ESD Tests 17 2.2.2 ESD Levels for IC Production 18 2.2.
3 Implications for System Level ESD 20 2.2.4 ESD Technology Roadmap 20 2.3 System Level ESD Tests 21 2.3.1 IEC 61000-4-2 22 2.4 ISO 10605 29 2.5 IEC 61000-4-5 31 2.
5.1 System Applications 32 2.5.2 Misconceptions and Miscorrelation of Component and System Level Tests 35 2.5.3 Hard Failures Due to IEC Testing 42 2.6 Soft Failures Due to IEC Testing 42 Acknowledgments 43 References 43 3 System Level Testing for ESD Susceptibility 46 Michael Hopkins 3.1 Introduction 46 3.
2 Objectives of System Level Testing 47 3.3 Compliance to ESD Standards 47 3.3.1 Legal Compliance Requirements 47 3.3.2 Compliance to Industry Requirements 48 3.4 Testing for Product Reliability 48 3.5 Standards Requirements for System Level Testing 49 3.
5.1 IEC 61000-4-2 49 3.5.2 Automotive Standards for ESD 58 3.5.3 Medical Standards for ESD 60 3.5.4 Avionics Standards for ESD 61 3.
5.5 Military ESD Standards 61 3.6 Using the IEC Simulator for Device Testing 62 3.7 Cable Discharge (CDE) Testing 63 3.7.1 Shielded Cables 65 3.7.2 Unshielded Cables 65 3.
7.3 Modified Transmission Line Pulsers (TLP) for CDE Testing 66 3.8 Evaluation of Test Results 67 3.8.1 Hard Failure Evaluation 67 3.8.2 Soft Failure Evaluation 67 3.9 The Quick Fix vs Root Cause Determination 67 3.
10 Determining Root Cause of System Level ESD 68 3.11 Reproducibility of System Level ESD Tests 70 Acknowledgments 72 References 72 4 PCB/IC Co-Design Concepts for SEED 74 Harald Gossner and Charvaka Duvvury 4.1 On-Chip System ESD Protection 74 4.1.1 HBM and CDM vs IEC 74 4.1.2 TLP Characterization 76 4.1.
3 TLP Correlation Issues 78 4.2 Off-Chip ESD Protection 79 4.3 Concept of PCB/IC Co-Design 82 4.3.1 On-Chip IEC Protection Solutions 84 4.4 Introduction to System Efficient ESD Design 84 4.4.1 Design Methods for SEED 90 4.
4.2 Basic Simulations using SEED 91 4.4.3 USB Design using SEED 94 4.5 Characterization for Hard Failures 97 4.6 Simulation of System Level ESD Discharge Paths 98 4.6.1 Simulation Approach 98 4.
6.2 Tools 101 4.6.3 ESD Model Types 103 4.6.4 Extraction of PCB Paths 104 4.6.5 Models of PCB Devices 104 4.
6.6 Characterization of IO Cells 106 4.6.7 Power Clamp Models 112 4.6.8 Model for Stress Waveform 114 4.7 Characterization of Soft Failures 116 4.7.
1 Purpose and Basic Concept 116 4.7.2 Pin Specific Soft Failure Characterization 120 4.7.3 Soft Failures Related to Signal Integrity Problems 123 4.8 Summary of SEED Characterization 125 Acknowledgments 126 References 127 5 Hard Failures and PCB Protection Devices 129 Robert Ashton 5.1 Introduction 129 5.2 ESD Damage to ICs 129 5.
3 Protection Methods 130 5.3.1 Classification of TVS Devices 133 5.4 Characteristics of Protection Devices 134 5.4.1 Current Limiting Devices 134 5.4.2 TVS Properties in Their Off-State 135 5.
4.3 Protection Properties of TVS Devices 137 5.5 Types of Protection Devices for ESD 142 5.5.1 Silicon Based TVS Devices 143 5.5.2 Metal Oxide Varistors 154 5.5.
3 Polymer Voltage Suppressors 155 5.5.4 Gas Discharge Tubes 156 5.5.5 Spark Gaps on PCBs 158 5.5.6 Thyristor Surge Protection Devices 159 5.5.
7 Ferrite Beads 159 5.5.8 Passive Components 161 5.5.9 Common Mode Filters 162 5.6 Primary and Secondary Protection 163 5.7 Evaluating IC Pins 164 5.8 Choosing ESD Protection Devices 164 5.
8.1 Coordination between TVS Device and Sensitive Nodes 165 5.9 Summary 167 References 167 6 Soft Failure Mechanisms and PCB Design Measures 169 David Pommerenke and Pratik Maheshwari 6.1 Introduction 169 6.2 Are HBM, CDM, MM, and Latch-Up Results Meaningful Soft Failures? 171 6.3 Classification of Soft Failure Modes 173 6.3.1 In-Band/Out-of-Band with Respect to Voltage 174 6.
3.2 In-Band/Out-of-Band with Respect to Pulse Width 175 6.3.3 Local vs Distant Errors 176 6.3.4 Amplified/Non-amplified Soft Failures 176 6.4 Optimized System Level Testing 178 6.5 Soft Failure Characterization Methods 182 6.
5.1 Susceptibility Scanning 183 6.5.2 Current Spreading Reconstruction 190 6.5.3 Local Injection 191 6.5.4 Software-Based Methods for Soft Failure Analysis 201 6.
6 Soft Failure Examples 205 6.6.1 Example 1: Soft Failure Caused by Field Injection on a DUT (Mini Photo Frame) 205 6.6.2 Example 2: PLL Disturbance Measurement 207 6.6.3 Example 3: Direct Field Coupling on the USB Data Bus 212 6.6.
4 Example 4: Direct Injection on the MIPI Bus Interface 215 6.7 Countermeasure Examples 216 6.7.1 Divert Current 216 6.7.2 Filtering 217 6.7.3 Shielding 217 6.
7.4 Secondary ESD Avoidance 218 6.7.5 Improved Connector-Cable Shield Connection 218 6.7.6 Enclosure to Connector Shield Junction 218 6.7.7 Firmware 218 6.
7.8 Reducing Crosstalk 219 6.7.9 Reduce ESD Current by Resistance 220 6.7.10 Avoid ESD 222 6.8 The Way Forward 223 Acknowledgment 230 References 231 7 ESD in Mobile Devices 234 Matti Uusimäki 7.1 Introduction 234 7.
2 ESD Energy Path in Mobile Device 234 7.3 ESD Generation Examples on a Large Scale 239 7.3.1 Large Machines Generating Charges to Their Isolated Bodies 239 7.3.2 Tribo-Electric Series 240 7.3.3 Charge Generated by a Person Inside a Car 240 7.
3.4 The Charge Generated to Mobile Device by Accident in Grounded System 241 7.3.5 Alternative Discharging Paths at Connection Moment 244 7.3.6 Charge Behavior at Insulator Surface 244 7.3.7 Example of Consumer Level Charge Generation with Simple Device 246 7.
4 Relation between Electrostatic Discharge Immunity Test and Real-World Discharge Waveforms 248 7.5 Laboratory Test Methods 248 7.6 Fast ESD and Slow ESD Concepts 249 7.7 Fast-ESD and Slow-ESD in a Mobile Device 250 7.7.1 Example of Ground Level Bounce Relative to an External Module 251 7.8 Isolating a Mobile Device 252 7.8.
1 Example 1: Material Thickness 252 7.8.2 Example 2: Solid Glue 253 7.8.3 Example 3: Positioning Holes in a Rubberized Key Mat 255 7.8.4 Example 4: Induced Electric Field 255 7.9 Shielding a Mobile Device 257 7.
10 Orientation Effects on ESD Path 259 7.10.1 ESD Path Example: Phone Face Up on Table 259 7.10.2 ESD Path Example: Phone Face Down on the Table 263 7.11 ESD Design in Practice 264 7.11.1 Grounding Challenges in Practice 264 7.
12 PCB Layout Considerations of Metal Shielding "Cans" 267 7.12.1 Components Near the Edge of the Shield 268 7.13 ESD Protection for Cable Interfaces 269 7.13.1 Cable Placement and Common Mode Current in a Mobile Device 270 7.13.2 Localizing Noise Current with Alternate Cabling Placement 274 7.
13.3 Cable Interface Protection Components 275 7.14 Common Mode Impedance Concerns for Layout 280 7.14.1 Common Mode Impedance Challenges in the Grounding Paths 280 7.14.2 Signals with Shared Common Mode Impedance 280 7.14.
3 Isolating Signals with Shield Grounded to Internal PCB Layers 282 7.14.4 Simulated Example of Ground Impedance Effect on ESD/EMI Filter Performance 283 7.14.5 ESD Protection on Stacked Chips 283 7.14.6 Layout Concerns around the Periphery and PCB Cutouts 285 7.15 ESD and Software Considerations in Mobile Devices 287 7.
15.1 Role of Software in EMC and ESD Design 287 7.15.2 Signal Sensitivity to ESD Examples 288 7.15.3 Delayed Effects on Software from ESD Events 290 7.16 Software Versions Utilized in Early ESD Immunity Testing 291 7.17 Conclusion 292 References 292 8 ESD for Automotive Applications 294 Wolfgang Reinprecht 8.
1 Introduction and Historical Aspects 294 8.1.1 Why Do Automotive Components Require High ESD Levels? 294 8.1.2 Field Return Rate of Automotive Products due to System Level ESD Events 296 8.1.3 ESD Related Field Returns Because of Incomplete Specification or Missing System Protection 297 8.2 Automotive Components 299 8.
2.1 Communication Systems CAN, LIN, FlexRay 299 8.2.2 Power Supply Systems as DCDC Converter, Alternator, LDO 303 8.2.3 Sensors and Sensor Interfaces 304 8.2.4 Keyless Entry/.