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2006 International Conference on Design and Test Integrated Systems in Nanoscale Technology
2006 International Conference on Design and Test Integrated Systems in Nanoscale Technology
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Author(s): Girard, Patrick
ISBN No.: 9780780397262
Year: 2006
Format: Trade Paper
Price: $ 350.00
Dispatch delay: Dispatched between 7 to 15 days
Status: Available
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