Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
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Author(s): Wang, Zhong Lin
ISBN No.: 9780521017954
Pages: 460
Year: 200508
Format: Trade Paper
Price: $ 88.19
Dispatch delay: Dispatched between 7 to 15 days
Status: Available

1. Kinematical electron diffraction; Part I. Diffraction of Reflected Electrons: 2. Reflection high-energy electron diffraction; 3. Dynamical theories of RHEED; 4. Resonance reflections in RHEED; Part II. Imaging of Reflected Electrons: 5. Imaging in TEM; 6.


Contrast mechanisms of reflected electron imaging; 7. Applications of UHV REM; 8. Applications of non-UHV REM; Part III. Inelastic Scattering and Spectrometry of Reflected Electrons. 9. Phonon scattering in RHEED; 10. Valence excitation in RHEED; 11. Atomic inner-shell excitations in RHEED; 12.


Novel techniques associated with reflection electron imaging. Appendix A: Physical constants, electron wavelengths and wave numbers. Appendix B: Crystal inner potential and atomic scattering factor; Appendix C.1: Crystallographic structure systems; Appendix C.2: FORTRAN program for calculating crystallographic data; Appendix D: Electron diffraction patterns of several types of crystals structures; Appendix E: FORTRAN programs; Appendix F: Bibliography of REM, SREM and REELS. References.


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