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Open Source TCAD/EDA for Compact Modeling
Open Source TCAD/EDA for Compact Modeling
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ISBN No.: 9789402410891
Pages: 250
Year: 202604
Format: Trade Cloth (Hard Cover)
Price: $ 207.08
Dispatch delay: Dispatched between 7 to 15 days
Status: Available (Forthcoming)

Preface. Introduction: Wladek Grabinski , GMC Suisse, Daniel Tomaszewski , ITE Warsaw Chapter 1: Numerical Cogenda TCAD MOSFET Device Simulations. Tutorial to Genius Device Simulator. Physics of Device Simulation. Numerical Method in Device Simulation. Device simulation: A MOS example. Chapter 2: Semiconductor Device Simulation Using DEVSIM; Juan E. Sanchez.


Introduction. BJT Physics. BJT Simulation. Conclusion and Future Work. Chapter 3: Device Level Parameter Extraction; Daniel Tomaszewski, Wladek Grabinski. Introduction. Parameter extractors overview. General optimization algorithms.


Profile1d: open source extractor. Examples: Diode, MOSCAP, BJT, MOSFET, IC Subcircuit. Summary. Appendix: List Profile1d commands. Chapter 4: Schematic entry and circuit simulation with Qucs; Mike Brinson. Introduction. The Qucs graphical user interface. Basic principles of circuit schematic capture.


Qucs parameter sweep techniques. Qucs small signal AC circuit and noise simulation. Qucs transient simulation. Qucs subcircuits. Including SPICE netlists in Qucs schematic diagrams. Qucs post-simulation data processing. Summary. Chapter 5: Qucs modeling and simulation of analog/RF devices and circuits; Mike Brinson.


Introduction. Circuit and system modeling using macromodels. Qucs equation-defined device models. Qucs and QucsStudio compact model development with the ADMS Verilog-A model synthesizer/compiler. QucsStudio implementation. More RF examples. From Qucs to QucsStudio: future directions in analog simulation and device modeling. Summary Chapter 6: Simulations of Digital IC Blocks; Zia Abbas, Antonio Mastrandrea, Francesco Menichelli and Mauro Olivieri.


Basics on Nano-scale Digital CMOS Analysis: Propagation Delay and Static Power. Basic Ngspice Delay and Leakage Current Analysis. Automated Delay Characterization of CMOS Standard Cells. Automated Leakage Current Characterization In CMOS Standard Cells. Additional Material. Chapter 7: Hybrid TCAD Circuit Simulations. Chapter 8: Standardized Data Exchange For Device Modeling Tools; Franz Sischka. General Requirements For A Data Format Standard.


Most Common Measurement Data Formats For Device Modeling. MDM (Measured Data Management) Format. Summary. Index.


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